Agencia Nacional de Investigación y Desarrollo2026-01-092026-01-09https://repositorio.ucn.cl/handle/20.500.14729/10244TESCAN TIMA is a field emission electron microscope that operates with energy-dispersive X-ray detectors and a backscattered electron detector. In the measurement chamber, it features a stage allowing automated scanning of hundreds of thousands of data points on polished surfaces of solid samples at the micrometer scale. The data captured by the TIMA software is processed offline to generate quantitative and semiquantitative information about compositional/mineral phases. This analysis greatly benefits applied mineralogy in the assessment of geological resources and geometallurgy, as well as in process engineering for predicting and monitoring metallurgical behavior. Its application extends to solid materials of scientific interest in materials science or industrial processes. Furthermore, the technique offers a high level of detail and precision in compositional identification, making it a valuable tool in material classification for disciplines such as geology, meteoritics, archaeometry, among others.Mineralogía